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Latest resources from NI
Engineer’s Guide to 5G Semiconductor Test
This paper assumes a basic familiarity with the 5G physical layer; it focuses on the new challenges of testing semiconductor devices for wideband...
Solution Flyer: RFIC Characterization
Automating Sub-mmWave Front-End Module, Transceiver, and Modem Test.
As development schedules shrink under time-to-market pressures and...
Engineer’s Guide to 5G Semiconductor Test
This Whitpaper paper focuses on the new challenges of testing semiconductor devices for wideband 5G applications.The enhanced mobile...
The Ultimate Guide to Managing Obsolescence in Aerospace and Defense
Test engineers spend as much as 50 percent of their time (or even more in some cases) actively dealing with obsolescence in their test program sets. ...
Fundamentals of Building a Test System
Most organizations do not consider production test a top priority, but it is a necessity to prevent major quality issues in the products...
Practical Guide to Maximizing DC Measurement Performance
This guide will begin by reviewing instrument fundamentals, learning how to use SMUs, and examining the features that can help you set up your...
Selecting an Approach to Build Flexible, Cost-Effective ECU Production Test Systems
ECUs became a standard component in most vehicles. As a computer designed to solve a very specific problem, the ECU is a fundamental component...
Key Considerations for Powertrain HIL Test
Safety, availability, and cost considerations can make performing thorough tests of embedded control devices using the complete system impractical....
Key Considerations for Powertrain HIL Test
Safety, availability, and cost considerations can make performing thorough tests of embedded control devices using the complete system...
Key Considerations for Powertrain HIL Test
Safety, availability, and cost considerations can make performing thorough tests of embedded control devices
using the complete system impractical....
